n overview the an78m00 and the an78m00f series are 3-pin fixed positive output voltage regulators. stabilized fixed output voltage is obtained from unstable dc input volt- age without using any external components. 11 types of fixed output voltage are available;5v, 6v, 7v, 8v, 9v, 10v, 12v, 15v, 18v, 20v and 24v. they can be used widely in power circuits with current capacitance up to 500ma. n features ? no external components ? output voltage:5v, 6v, 7v, 8v, 9v, 10v, 12v, 15v, 18v, 20v, 24v ? short-circuit current limiting built-in ? thermal overload protection built-in ? output transistor safe area compensation an78m00/an78m00f series 3-pin positive output voltage regulators (500ma type) n block diagram unit:mm an78m00 series 10.4 0.5 1.4 0.1 2.9 0.1 6.7 0.25 8.7 0.3 13.6 0.25 1.4 0.25 4.5 ?.7 10.5 0.5 2.54 0.45 1:input 2:common 3:output 2.5 0.25 + 0.1 ?0.05 123 4.5 0.3 jedec:to-220ab (hsip003-p-0000) 0.8 0.2 unit:mm an78m00f series 16.7 0.3 17.0 0.25 4.2 0.25 3.8 0.25 8.7 0.3 13.6 0.25 4.5 0.25 1.4 0.2 to-220 full pack package (hsip003-p-0000a) 10.5 0.3 2.77 0.3 (1.73) 123 ?.3 ?.1 0.1 (4.3) 2.5 0.25 4.5 0.3 1:input 2:common 3:output 2.0 0.25 0.8 0.2 (0.4) 2.54 0.4 + 0.1 ?0.05 1 3 2 input pass tr output common starter voltage reference current source error amp. + thermal protection q 1 r sc r 2 r 1 current limiter
v i p d t opr t stg v v w ?c ?c n absolute maximum ratings (ta=25?c) 35 * 1 40 * 2 15 * 3 10.25 * 3 ?0 to +80 ?5 to +150 input voltage power dissipation operating ambient temperature storage temperature an7800 series an7800f series * 1 an78m05/f, an78m06/f, an78m07/f, an78m08/f, an78m09/f, AN78M10/f, an78m12/f, an78m15/f, an78m18/f * 2 an78m20/f, an78m24/f * 3 follow the derating curve. when t j exceeds 150?c, the internal circuit cuts off the output. parameter symbol rating unit output voltage v o 5.2 v 5 t j =25?c output voltage tolerance v o v v i =7.5 to 20v, i o =5 to 350ma, t j =25?c, p d * line regulation reg in 100 mv 3 v i =7.5 to 25v, t j =25?c mv load regulation reg l mv 20 i o =5 to 500ma, t j =25?c mv i o =5 to 200ma, t j =25?c v i =8 to 25v, t j =25?c ma 4 t j =25?c 1 bias current i bias ma v i =8 to 25v, t j =25?c input bias current fluctuation ma load bias current fluctuation 40 i o =5 to 350ma, t j =25?c output noise voltage v no db f=10hz to 100khz 0.8 0.5 50 5.25 100 50 6 62 4.8 4.75 ripple rejection ratio rr v i =8 to 18v, i o =100ma, f=120hz v 2 i o =500ma, t j =25?c minimum input/output voltage difference ma 300 output short circuit current ma 700 v i =35v, t j =25?c 10 peak output current t j =25?c ?0.5 output voltage temperature coefficient i o =5ma, t j =0 to 125?c parameter symbol condition min typ max unit d i bias (in) d i bias (l) v v dif (min.) i o (short) i o (peak) mv/?c d v o /ta note 1) the specified condition t j =25?c means that the test should be carried out with the test time so short (within 10ms) that the drift in characteristic value due to the rise in chip junction temperature can be ignored. note 2) when not specified, v i =10v, i o =350ma, c i =0.33 f and c o =0.1 f. * an78m00 series:15w, an78m00f series:10.25w n electrical characteristics (ta=25?c) = < an78m05/78m05f (5v type)
v o 6.25 v 6 t j =25?c v o v v i =8.5 to 21v, i o =5 to 350ma, t j =25?c, p d * reg in 100 mv 5 v i =8.5 to 25v, t j =25?c mv reg l mv 20 i o =5 to 500ma, t j =25?c mv i o =5 to 200ma, t j =25?c v i =9 to 25v, t j =25?c ma 4 t j =25?c 1.5 i bias ma v i =9 to 25v, t j =25?c ma 45 i o =5 to 350ma, t j =25?c v no db f=10hz to 100khz 0.8 0.5 50 6.3 120 60 6 59 5.75 5.7 rr v i =9 to 19v, i o =100ma, f=120hz v 2 i o =500ma, t j =25?c ma 300 ma 700 v i =35v, t j =25?c 10 t j =25?c ?0.5 i o =5ma, t j =0 to 125?c output voltage output voltage tolerance line regulation load regulation bias current input bias current fluctuation load bias current fluctuation output noise voltage ripple rejection ratio minimum input/output voltage difference output short circuit current peak output current output voltage temperature coefficient parameter symbol condition min typ max unit d i bias (in) d i bias (l) v v dif (min.) i o (short) i o (peak) mv/?c d v o /ta note 1) the specified condition t j =25?c means that the test should be carried out with the test time so short (within 10ms) that the drift in characteristic value due to the rise in chip junction temperature can be ignored. note 2) when not specified, v i =11v, i o =350ma, c i =0.33 f and c o =0.1 f. * an78m00 series:15w, an78m00f series:10.25w n electrical characteristics (ta=25?c) = < an78m06/78m06f (6v type) v o 7.3 v 7 t j =25?c v o v v i =9.5 to 22v, i o =5 to 350ma, t j =25?c, p d * reg in 100 mv 6 v i =9.5 to 25v, t j =25?c mv reg l mv 20 i o =5 to 500ma, t j =25?c mv i o =5 to 200ma, t j =25?c v i =10 to 25v, t j =25?c ma 4 t j =25?c 2 i bias ma v i =10 to 25v, t j =25?c ma 48 i o =5 to 350ma, t j =25?c v no db f=10hz to 100khz 0.8 0.5 50 7.35 140 70 6 57 6.7 6.65 rr v i =10 to 20v, i o =100ma, f=120hz v 2 i o =500ma, t j =25?c ma 300 ma 700 v i =35v, t j =25?c 10 t j =25?c ?0.5 i o =5ma, t j =0 to 125?c output voltage output voltage tolerance line regulation load regulation bias current input bias current fluctuation load bias current fluctuation output noise voltage ripple rejection ratio minimum input/output voltage difference output short circuit current peak output current output voltage temperature coefficient parameter symbol condition min typ max unit d i bias (in) d i bias (l) v v dif (min.) i o (short) i o (peak) mv/?c d v o /ta note 1) the specified condition t j =25?c means that the test should be carried out with the test time so short (within 10ms) that the drift in characteristic value due to the rise in chip junction temperature can be ignored. note 2) when not specified, v i =12v, i o =350ma, c i =0.33 f and c o =0.1 f. * an78m00 series:15w, an78m00f series:10.25w = < an78m07/78m07f (7v type)
v o 8.3 v 8 t j =25?c v o v v i =10.5 to 23v, i o =5 to 350ma, t j =25?c, p d * reg in 100 mv 6 v i =10.5 to 25v, t j =25?c mv reg l mv 25 i o =5 to 500ma, t j =25?c mv i o =5 to 200ma, t j =25?c v i =11 to 25v, t j =25?c ma 4.1 t j =25?c 2 i bias ma v i =10.5 to 25v, t j =25?c ma 52 i o =5 to 350ma, t j =25?c v no db f=10hz to 100khz 0.8 0.5 50 8.4 160 80 6 56 7.7 7.6 rr v i =11.5 to 21.5v, i o =100ma, f=120hz v 2 i o =500ma, t j =25?c ma 300 ma 700 v i =35v, t j =25?c 10 t j =25?c ?0.5 i o =5ma, t j =0 to 125?c output voltage output voltage tolerance line regulation load regulation bias current input bias current fluctuation load bias current fluctuation output noise voltage ripple rejection ratio minimum input/output voltage difference output short circuit current peak output current output voltage temperature coefficient parameter symbol condition min typ max unit d i bias (in) d i bias (l) v v dif (min.) i o (short) i o (peak) mv/?c d v o /ta note 1) the specified condition t j =25?c means that the test should be carried out with the test time so short (within 10ms) that the drift in characteristic value due to the rise in chip junction temperature can be ignored. note 2) when not specified, v i =14v, i o =350ma, c i =0.33 f and c o =0.1 f. * an78m00 series:15w, an78m00f series:10.25w n electrical characteristics (ta=25?c) = < an78m08/78m08f (8v type) v o 9.35 v 9 t j =25?c v o v v i =11.5 to 24v, i o =5 to 350ma, t j =25?c, p d * reg in 100 mv 7 v i =11.5 to 25v, t j =25?c mv reg l mv 25 i o =5 to 500ma, t j =25?c mv i o =5 to 200ma, t j =25?c v i =12 to 25v, t j =25?c ma 4.1 t j =25?c 2 i bias ma v i =12 to 25v, t j =25?c ma 60 i o =5 to 350ma, t j =25?c v no db f=10hz to 100khz 0.8 0.5 50 9.45 180 90 6 56 8.65 8.55 rr v i =12 to 22v, i o =100ma, f=120hz v 2 i o =500ma, t j =25?c ma 300 ma 700 v i =35v, t j =25?c 10 t j =25?c ?0.5 i o =5ma, t j =0 to 125?c output voltage output voltage tolerance line regulation load regulation bias current input bias current fluctuation load bias current fluctuation output noise voltage ripple rejection ratio minimum input/output voltage difference output short circuit current peak output current output voltage temperature coefficient parameter symbol condition min typ max unit d i bias (in) d i bias (l) v v dif (min.) i o (short) i o (peak) mv/?c d v o /ta note 1) the specified condition t j =25?c means that the test should be carried out with the test time so short (within 10ms) that the drift in characteristic value due to the rise in chip junction temperature can be ignored. note 2) when not specified, v i =15v, i o =350ma, c i =0.33 f and c o =0.1 f. * an78m00 series:15w, an78m00f series:10.25w = < an78m09/78m09f (9v type)
v o 10.4 v 10 t j =25?c v o v v i =12.5 to 25v, i o =5 to 350ma, t j =25?c, p d * reg in 100 mv 7 v i =12.5 to 30v, t j =25?c mv reg l mv 25 i o =5 to 500ma, t j =25?c mv i o =5 to 200ma, t j =25?c v i =13 to 25v, t j =25?c ma 4.1 t j =25?c 2 i bias ma v i =13 to 25v, t j =25?c ma 65 i o =5 to 350ma, t j =25?c v no db f=10hz to 100khz 0.8 0.5 50 10.5 200 100 6 56 9.6 9.5 rr v i =13 to 23v, i o =100ma, f=120hz v 2 i o =500ma, t j =25?c ma 300 ma 700 v i =35v, t j =25?c 10 t j =25?c ?0.5 i o =5ma, t j =0 to 125?c output voltage output voltage tolerance line regulation load regulation bias current input bias current fluctuation load bias current fluctuation output noise voltage ripple rejection ratio minimum input/output voltage difference output short circuit current peak output current output voltage temperature coefficient parameter symbol condition min typ max unit d i bias (in) d i bias (l) v v dif (min.) i o (short) i o (peak) mv/?c d v o /ta note 1) the specified condition t j =25?c means that the test should be carried out with the test time so short (within 10ms) that the drift in characteristic value due to the rise in chip junction temperature can be ignored. note 2) when not specified, v i =16v, i o =350ma, c i =0.33 f and c o =0.1 f. * an78m00 series:15w, an78m00f series:10.25w = < AN78M10/78m10f (10v type) n electrical characteristics (ta=25?c) v o 12.5 v 12 t j =25?c v o v v i =14.5 to 27v, i o =5 to 350ma, t j =25?c, p d * reg in 100 mv 8 v i =14.5 to 30v, t j =25?c mv reg l mv 25 i o =5 to 500ma, t j =25?c mv i o =5 to 200ma, t j =25?c v i =16 to 30v, t j =25?c ma 4.3 t j =25?c 2 i bias ma v i =14.5 to 30v, t j =25?c ma 75 i o =5 to 350ma, t j =25?c v no db f=10hz to 100khz 0.8 0.5 50 12.6 240 120 6 55 11.5 11.4 rr v i =15 to 25v, i o =100ma, f=120hz v 2 i o =500ma, t j =25?c ma 300 ma 700 v i =35v, t j =25?c 10 t j =25?c ?0.8 i o =5ma, t j =0 to 125?c output voltage output voltage tolerance line regulation load regulation bias current input bias current fluctuation load bias current fluctuation output noise voltage ripple rejection ratio minimum input/output voltage difference output short circuit current peak cutput current output voltage temperature coefficient parameter symbol condition min typ max unit d i bias (in) d i bias (l) v v dif (min.) i o (short) i o (peak) mv/?c d v o /ta note 1) the specified condition t j =25?c means that the test should be carried out with the test time so short (within 10ms) that the drift in characteristic value due to the rise in chip junction temperature can be ignored. note 2) when not specified, v i =19v, i o =350ma, c i =0.33 f and c o =0.1 f. * an78m00 series:15w, an78m00f series:10.25w an78m12/78m12f (12v type) = <
v o 15.6 v 15 t j =25?c v o v v i =17.5 to 30v, i o =5 to 350ma, t j =25?c, p d * reg in 100 mv 10 v i =17.5 to 30v, t j =25?c mv reg l mv 25 i o =5 to 500ma, t j =25?c mv i o =5 to 200ma, t j =25?c v i =20 to 30v, t j =25?c ma 4.3 t j =25?c 3 i bias ma v i =17.5 to 30v, t j =25?c ma 90 i o =5 to 350ma, t j =25?c v no db f=10hz to 100khz 0.8 0.5 50 15.75 300 150 6 54 14.4 14.25 rr v i =18.5 to 28.5v, i o =100ma, f=120hz v 2 i o =500ma, t j =25?c ma 300 ma 700 v i =35v, t j =25?c 10 t j =25?c ? i o =5ma, t j =0 to 125?c output voltage output voltage tolerance line regulation load regulation bias current input bias current fluctuation load bias current fluctuation output noise voltage ripple rejection ratio minimum input/output voltage difference output short circuit current peak output current output voltage temperature coefficient parameter symbol condition min typ max unit d i bias (in) d i bias (l) v v dif (min.) i o (short) i o (peak) mv/?c d v o /ta note 1) the specified condition t j =25?c means that the test should be carried out with the test time so short (within 10ms) that the drift in characteristic value due to the rise in chip junction temperature can be ignored. note 2) when not specified, v i =23v, i o =350ma, c i =0.33 f and c o =0.1 f. * an78m00 series:15w, an78m00f series:10.25w = < an78m15/78m15f (15v type) n electrical characteristics (ta=25?c) v o 18.7 v 18 t j =25?c v o v v i =21 to 33v, i o =5 to 350ma, t j =25?c, p d * reg in 100 mv 10 v i =21 to 33v, t j =25?c mv reg l mv 30 i o =5 to 500ma, t j =25?c mv i o =5 to 200ma, t j =25?c v i =22 to 33v, t j =25?c ma 4.4 t j =25?c 5 i bias ma v i =21 to 33v, t j =25?c ma 100 i o =5 to 350ma, t j =25?c v no db f=10hz to 100khz 0.8 0.5 50 18.9 360 180 6 53 17.3 17.1 rr v i =22 to 32v, i o =100ma, f=120hz v 2 i o =500ma, t j =25?c ma 300 ma 700 v i =35v, t j =25?c 10 t j =25?c ?.0 i o =5ma, t j =0 to 125?c output voltage output voltage tolerance line regulation load regulation bias current input bias current fluctuation load bias current fluctuation output noise voltage ripple rejection ratio minimum input/output voltage difference output short circuit current peak output current output voltage temperature coefficient parameter symbol condition min typ max unit d i bias (in) d i bias (l) v v dif (min.) i o (short) i o (peak) mv/?c d v o /ta note 1) the specified condition t j =25?c means that the test should be carried out with the test time so short (within 10ms) that the drift in characteristic value due to the rise in chip junction temperature can be ignored. note 2) when not specified, v i =27v, i o =350ma, c i =0.33 f and c o =0.1 f. * an78m00 series:15w, an78m00f series:10.25w = < an78m18/78m18f (18v type)
v o 20.8 v 20 t j =25?c v o v v i =23 to 35v, i o =5 to 350ma, t j =25?c, p d * reg in 100 mv 10 v i =23 to 35v, t j =25?c mv reg l mv 30 i o =5 to 500ma, t j =25?c mv i o =5 to 200ma, t j =25?c v i =24 to 35v, t j =25?c ma 4.4 t j =25?c 5 i bias ma v i =23 to 35v, t j =25?c ma 110 i o =5 to 350ma, t j =25?c v no db f=10hz to 100khz 0.8 0.5 50 21 400 200 6 53 19.2 19 rr v i =24 to 34v, i o =100ma, f=120hz v 2 i o =500ma, t j =25?c ma 300 ma 700 v i =35v, t j =25?c 10 t j =25?c ?.0 i o =5ma, t j =0 to 125?c output voltage output voltage tolerance line regulation load regulation bias current input bias current fluctuation load bias current fluctuation output noise voltage ripple rejection ratio minimum input/output voltage difference output short circuit current peak output current output voltage temperature coefficient parameter symbol condition min typ max unit d i bias (in) d i bias (l) v v dif (min.) i o (short) i o (peak) mv/?c d v o /ta note 1) the specified condition t j =25?c means that the test should be carried out with the test time so short (within 10ms) that the drift in characteristic value due to the rise in chip junction temperature can be ignored. note 2) when not specified, v i =29v, i o =350ma, c i =0.33 f and c o =0.1 f. * an78m00 series:15w, an78m00f series:10.25w n electrical characteristics (ta=25?c) = < an78m20/78m20f (20v type) v o 25 v 24 t j =25?c v o v v i =27 to 38v, i o =5 to 350ma, t j =25?c, p d * reg in 100 mv 10 v i =27 to 38v, t j =25?c mv reg l mv 30 i o =5 to 500ma, t j =25?c mv i o =5 to 200ma, t j =25?c v i =28 to 38v, t j =25?c ma 4.5 t j =25?c 5 i bias ma v i =27 to 38v, t j =25?c ma 170 i o =5 to 350ma, t j =25?c v no db f=10hz to 100khz 0.8 0.5 50 25.2 480 240 6 50 23 22.8 rr v i =28 to 38v, i o =100ma, f=120hz v 2 i o =500ma, t j =25?c ma 300 ma 700 v i =35v, t j =25?c 10 t j =25?c ?.2 i o =5ma, t j =0 to 125?c output voltage output voltage tolerance line regulation load regulation bias current input bias current fluctuation load bias current fluctuation output noise voltage ripple rejection ratio minimum input/output voltage difference output short circuit current peak output current output voltage temperature coefficient parameter symbol condition min typ max unit d i bias (in) d i bias (l) v v dif (min.) i o (short) i o (peak) mv/?c d v o /ta note 1) the specified condition t j =25?c means that the test should be carried out with the test time so short (within 10ms) that the drift in characteristic value due to the rise in chip junction temperature can be ignored. note 2) when not specified, v i =33v, i o =350ma, c i =0.33 f and c o =0.1 f. * an78m00 series:15w, an78m00f series:10.25w = < an78m24/78m24f (24v type)
n characteristic curve 200ma 100ma 10ma 0ma 2.5 2.0 1.5 1.0 0.5 0 ?0 0 50 100 150 junction temperature t j (?c) minimum input/output voltage difference v dif (min.) (v) v dif (min.) ? j 16 14 12 10 8 6 4 2 0 0 40 80 120 160 ambient temperature ta (?c) power dissipation p d (w) p d ?a (an78m00f series) (1) (3) (4) (2) 16 14 12 10 8 6 4 2 0 0 40 80 120 160 ambient temperature ta (?c) power dissipation p d (w) p d ?a (an78m00 series) (1) infinite heat sink (2) 5?c/w heat sink (3) 15 ?c /w heat sink (4) without heat sink (1) infinite heat sink (2) 5?c/w heat sink (3) 15?c/w heat sink (4) without heat sink (2) (3) (4) (1) an78m05 i o =500ma 024 an78m05 6810 time t ( s) 10 0 ?0 ?0 20 15 10 5 output voltage fluctuation (mv) input voltage v i (v) input transient response 01020 an78m05 30 40 50 time t ( s) 1 0 ? ? 2 1 0 output voltage fluctuation (v) load current i o (a) load transient response 7 6 5 4 3 2 1 0 0 0.3 0.6 0.9 1.2 output current i o (a) output voltage v o (v) current limiting v i =10v v o =5v t j =25?c c i is set when the input line is long. c o improves the transient response. c o c i input output an78m00 an78m00f common 1 3 2 n basic regulator circuit
n application circuit v o v o 0.33 f 0.1 f 0.1 f v i i i i o v i v o +v i ? i i o i bias i bias v o = v o + i bias + r 1 i o = + i bias r 2 v o r 1 v o 0.33 f 0.33 f 3 10k 910 9.1k q 1 an78m00 an78m00f an78m00 an78m00f an78m00 an78m00f an78m00 an78m00f 1 1 2 2 3 3 1 3 2 2 3 1 r 2 r 1 r 1 r 2 r 1 v o = v o v o varies with the value of the input voltage v 1 . (in case of r 1 + r 2 =10k ) r 1 r 1 + r 2 9.1k 910 v o v o v o + an6562
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